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The IET's new Guide on EMC for Functional Safety
The continuing increases in electronic complexity, and the continuing shrinking of the feature sizes in siliconintegrated circuits, has made the normal testing-based approach to EMC inadequate where safety isconcerned. So the new discipline of “EMC for Functional Safety” has recently been developed to helpmaintain tolerable levels of safety risks.
Originally published in PSB Magazine, November 2008
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